Program Outcomes
Electron Microscopy, 10-636-1
Upon successful completion of this program the graduate will be able to:
- Perform electron gun and full column alignment on both the SEM and TEM, to include critical objective astigmatism correction.
- Identify SEM variables required for various sample and signal generation/collection situations and adjust accordingly.
- Perform basic vacuum system startup, valving, shutdown, and maintenance.
- Prepare an IC using Focused Ion Beam, tripod and planar polishing techniques for TEM and SEM.
- Prepare required solutions and perform fixation, dehydration, and embedment or CPD/FF of various samples for TEM or SEM analysis.
- Obtain artifact-free (knife marks, chatter, and/or compression) thick (0.5 um) and thin (100 nm) sections of mammalian, botanical and materials samples for TEM analysis.
- Index single crystal and polycrystalline electron diffraction patterns for identification of crystal lattice orientation and compound identification.
- Identify the structure and basic function of cellular organelles in mammalian tissues.
- Perform electron gun filament change, aperture cleaning, and basic electronic troubleshooting to maintain equipment found in electron microscope labs.
- Develop work habits such as timeliness, attendance, interpersonal skills, and communication skills consistent with employment requirements.
- Be familiar with basic metallurgical principals such as phase diagrams, annealing, diffusion, dislocations, and twinning.
- Evaluate sample and select proper SEM variables to collect representative x-ray spectra for accurate qualitative and standardless quantitative analysis.
Revised 8/31/04
Back to Electron Microscopy
Back to Program Outcomes
|
